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http://nopr.niscpr.res.in/handle/123456789/1331Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hsieh, K-L | - |
| dc.date.accessioned | 2008-05-19T11:29:09Z | - |
| dc.date.available | 2008-05-19T11:29:09Z | - |
| dc.date.issued | 2007-11 | - |
| dc.identifier.issn | 0022-4456 | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/1331 | - |
| dc.description | 891-897 | en_US |
| dc.description.abstract | In this study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan has been applied to verify rationality and feasibility of proposed procedure. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | CSIR | en_US |
| dc.source | JSIR Vol.66(11) [November 2007] | en_US |
| dc.subject | Backpropagation neural network model | en_US |
| dc.subject | Critical areas | en_US |
| dc.subject | Critical layers | en_US |
| dc.subject | Liquid crystal displays (LCDs) | en_US |
| dc.subject | Stepwise regression technique | en_US |
| dc.title | Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | JSIR Vol.66(11) [November 2007] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JSIR 66(11) (2007) 891-897.pdf | 93.64 kB | Adobe PDF | View/Open |
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