Please use this identifier to cite or link to this item:
http://nopr.niscpr.res.in/handle/123456789/13563| Title: | Postharvest Technology |
| Issue Date: | Oct-2011 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | The effects of freezing process and frozen storage at isothermal (−7, −15 and −25 C) and nonisothermal (accelerated life testing with step-stressmethodology; temperature range from −30 to −5 °C) conditions on pumpkin quality were investigated. |
| Page(s): | 224 |
| Appears in Collections: | NPARR Vol.2(4) [October 2011] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| NPARR 2(4) 224.pdf | 51.66 kB | Adobe PDF | View/Open |
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