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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Dighe, P M | - |
| dc.contributor.author | Kamble, L P | - |
| dc.contributor.author | Das, D | - |
| dc.contributor.author | Pithawa, C K | - |
| dc.date.accessioned | 2012-06-29T09:24:31Z | - |
| dc.date.available | 2012-06-29T09:24:31Z | - |
| dc.date.issued | 2012-07 | - |
| dc.identifier.issn | 0975-1041 (Online); 0019-5596 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/14302 | - |
| dc.description | 458-461 | en_US |
| dc.description.abstract | Ion chamber sensitive to low energy pulsed X-rays has been developed for area monitoring at the electron accelerators Indus 1 and 2 of Raja Ramanna Centre for Advanced Technology, Indore. Conventional monitors available commercially underestimate the X-ray background because of pulsed nature of the radiation and are not sensitive to X-rays below 100 keV. For this purpose, a high pressure ion chamber made of aluminium with all welded construction has been developed and tested for use in pulsed X-ray background. The chamber has 25 litre sensitive volume, filled with nitrogen at 85 psi and current sensitivity is 12 nA/R/h. The chamber can measure exposure levels from 20 mR/h to 100 mR/h and has uniform energy response within ±12% from 35 keV to 1.25 MeV of X-ray energy. The ion chamber gave more than 86% collection efficiency at 100 mR/h average pulsed X-ray background for 500 V operating voltage. Theoretically evaluated collection efficiency values closely match with the experimentally observed values. The design details and characterisation of the ion chamber under different X-ray energy exposures and collection efficiency estimation for pulsed X-ray background have been studied. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | IJPAP Vol.50(07) [July 2012] | en_US |
| dc.subject | Ion Chamber | en_US |
| dc.subject | Pulsed X-ray | en_US |
| dc.subject | Electron accelerator | en_US |
| dc.subject | Area monitoring | en_US |
| dc.title | Low energy pulsed X-ray ion chamber monitor for accelerator safety | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJPAP Vol.50(07) [July 2012] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJPAP 50(7) 458-461.pdf | 217.7 kB | Adobe PDF | View/Open |
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