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http://nopr.niscpr.res.in/handle/123456789/14522Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hagos, Kiros | - |
| dc.contributor.author | Jayanth, C V | - |
| dc.contributor.author | Somashekar, R | - |
| dc.date.accessioned | 2012-08-07T05:56:17Z | - |
| dc.date.available | 2012-08-07T05:56:17Z | - |
| dc.date.issued | 2012-08 | - |
| dc.identifier.issn | 0975-1084 (Online); 0022-4456 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/14522 | - |
| dc.description | 534-538 | en_US |
| dc.description.abstract | This study presents X-ray studies to investigate effect of microwave radiation and solvent treatment of white and red teff grains normally grown in Ethiopia. Studies were correlated for a better understanding of these grains. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | JSIR Vol.71(08) [August 2012] | en_US |
| dc.subject | Microwave radiation | en_US |
| dc.subject | Solvent treatment | en_US |
| dc.subject | White and red teff grains | en_US |
| dc.subject | X-ray studies | en_US |
| dc.title | Characterization of white and red teff grains using X-ray technique | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | JSIR Vol.71(08) [August 2012] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JSIR 71(8) 534-538.pdf | 172.61 kB | Adobe PDF | View/Open |
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