Development of Wavelength Dispersive X-ray Spectrometer

Abstract

A linear type wavelength dispersive x-ray spectrometer is designed, fabricated assembled, and tested for elemental analysis. Four analyzing crystals (mounted on a turret) cover the detection range from at no. 5 (boron) to at. no. 92

(uranium). A digital electronic control system is designed and tested for setting the crystal position with the help of a stepper motor. The motion of the turret on lead screw can be controlled to a high degree of accuracy with the electronic control system. It is possible to scan the x-ray spectrum range, as mentioned above. The ability to scan gives easy operational flexibility and opportunity to search over an extensive wavelength range. Samples of brass, stainless steel, and mixture of five adjacent elements (Fe, Co, Ni, Cu and Zn) are analysed by this instrument. X-ray analysis peaks of different elements present, in the sample are recorded on a strip chart recorder and well resolved. This instrument can be utilized for x- ray fluorescence or an integral part of scanning electron microscope (SEM) for elemental analysis.