Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/17718
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dc.contributor.authorKarak, Niranjan-
dc.date.accessioned2013-05-02T05:24:16Z-
dc.date.available2013-05-02T05:24:16Z-
dc.date.issued2002-08-
dc.identifier.issn0975-1084 (Online); 0022-4456 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/17718-
dc.description571-585en_US
dc.description.abstractDevelopment of 157 nm photoresist polymers for F2 laser lithography is a great challenge to polymer scientists and technologists. 157 nm lithography has emerged as the promising candidate for extending conventional photolithographic methods to the sub- 100 nm device generation for the electronic applications. Among the difficulties of several daunting materials challenge for this development, transparency of the photoresist polymer is the most difficult job. The review attempts to investigate the problems, significance, and the recent development strategies of photoresist polymers for 157 nm lithography.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceJSIR Vol.61(08) [August 2002]en_US
dc.titleDevelopment of 157 nm Photoresist Polymers for F2 Laser Lithographyen_US
dc.typeArticleen_US
Appears in Collections:JSIR Vol.61(08) [August 2002]

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