A rapid flame atomic absorption spectroscopic procedure for determination of lead in aluminium base alloys

Rao, A S; Gupta, K K; Sircar, J K; Srivastava, S C

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Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/18823

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DC Field	Value	Language
dc.contributor.author	Rao, A S	-
dc.contributor.author	Gupta, K K	-
dc.contributor.author	Sircar, J K	-
dc.contributor.author	Srivastava, S C	-
dc.date.accessioned	2013-06-08T10:04:51Z	-
dc.date.available	2013-06-08T10:04:51Z	-
dc.date.issued	2004-07	-
dc.identifier.issn	0975-0991 (Online); 0971-457X (Print)	-
dc.identifier.uri	http://hdl.handle.net/123456789/18823	-
dc.description	475-478	en_US
dc.description.abstract	A rapid and sensitive technique to determine lead in trace level present in aluminium based alloys by flame atomic absorption spectroscopic technique (AAS) is described. It is free from aluminium and silicon spectral interferences. The method is free from associated alloying elements. Lead was determined at 283.3 nm using air-acetylene flame. The value of relative standard deviation (r.s.d.) of lead, in case of high silicon containing samples is found to be 2.545% and that for low ones 10-12% respectively. The standard deviation values were +/- 0.0014 and +/-0.0016 respectively. A threshold limit of concentration of aluminium and silicon for the determination of lead in final analyte solution has been described and this has been correlated with the sample weight to be taken for analysis.	en_US
dc.language.iso	en_US	en_US
dc.publisher	NISCAIR-CSIR, India	en_US
dc.relation.ispartofseries	G01J 3/00, C22C 45/00	en_US
dc.rights	CC Attribution-Noncommercial-No Derivative Works 2.5 India	en_US
dc.source	IJCT Vol.11(4) [July 2004]	en_US
dc.subject	Lead determination	en_US
dc.subject	Alluminium alloy	en_US
dc.subject	Atomic absorption spectroscopy	en_US
dc.title	A rapid flame atomic absorption spectroscopic procedure for determination of lead in aluminium base alloys	en_US
dc.type	Article	en_US
Appears in Collections:	IJCT Vol.11(4) [July 2004]

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