Synthesis and characterization of solution processed BiFeO₃-PbTiO₃ thin films

Abstract

In this paper, the growth and characterization of polycrystalline (BiFeO₃)₁₋x (PbTiO₃)x solid solutions of composition near morphotropic phase boundary (MPB) have been reported. The films are deposited on platinized silicon (111) Pt/Ti/SiO₂/Si substrate by chemical solution deposition method using spin coating technique. Morphological analysis was made by means of scanning electron microscopy. Grazing incidence X-ray diffractometry revealed the perovskite structure of the films. Although, room temperature dielectric constant (k’) suggested that the films have reasonable insulation resistance but ferroelectric measurements show the presence of a leaky hysteresis behaviour in thin films.