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dc.contributor.authorMaan, A S-
dc.contributor.authorGoyal, D R-
dc.date.accessioned2008-09-10T11:26:24Z-
dc.date.available2008-09-10T11:26:24Z-
dc.date.issued2008-04-
dc.identifier.issn0971-4588-
dc.identifier.urihttp://hdl.handle.net/123456789/1975-
dc.description207-210en_US
dc.description.abstractIn this paper, the dielectric properties of In₄₀SexTe₆₀₋x glassy alloys (x = 10, 20 & 30) have been reported. These measurements are carried out as a function of temperature and frequency in the range 120-350 K and 0.1-10 kHz respectively. The frequency and temperature dependence of dielectric constant Ɛ΄ and dielectric loss Ɛ΄΄ is almost similar in nature in all the alloys and the experimental results indicate that dielectric dispersion sets in at temperature exceeding 150 K and is more prominent at lower frequencies. Ɛ΄ and Ɛ΄΄ values as a function of temperature and frequency are maximum for x = 20 alloy, though similar behaviour is observed in all the samples. The experimental results seem to be explained in terms of the theory of dielectric dispersion based on two electrons hopping over a potential barrier. The frequency dependence of dielectric loss in present set of glasses at a fixed temperature is in good agreement with theory of dielectric dispersion.en_US
dc.language.isoen_USen_US
dc.publisherCSIRen_US
dc.sourceIJEMS Vol.15(2) [April 2008]en_US
dc.titleDielectric properties of In-Se-Te glassy alloysen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.15(2) [April 2008]

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