Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/22091
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dc.contributor.authorNataraj, D-
dc.contributor.authorSenthil, K-
dc.contributor.authorNarayandass, Sa K-
dc.contributor.authorMangalaraj, D-
dc.date.accessioned2013-10-15T17:42:24Z-
dc.date.available2013-10-15T17:42:24Z-
dc.date.issued1999-06-
dc.identifier.issn0975-1017 (Online); 0971-4588 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/22091-
dc.description164-169en_US
dc.description.abstractBi2Se3 thin films, prepared by thermal evaporation onto well-cleaned glass and freshly cleaved KBr substrates, have been annealed for 30 min under a vacuum pressure of 2.7x10-3 Pa at different temperatures (373-473 K). The variation in optical constants with annealing temperature for these films has been studied in detail. Large changes in transmittance (ΔT= 13% at 633 nm), reflectance (ΔR =8% at 633 nm) and high absorption coefficient (α>104cm-1) are noticed for these annealed films. Thin film capacitors (Al –Bi2Se3-Al) have also been fabricated and studies on capacitance and dielectric constant as a function of temperature and frequency carried out. Loss minimum (tanδmin) has been observed and found to shift towards high frequency side as the temperature increases. The frequency and temperature dependence of their ac conductivity reveal that the conduction in these films proceeds via electron hopping.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.06(3) [June 1999]en_US
dc.titleEffect of annealing on optical, dielectric and ac conduction properties of Bi2Se3 thin filmsen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.06(3) [June 1999]

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