Molecular tagging of gene conferring leaf blight resistance using micro satellites in sorghum [<i>Sorghum bicolor</i> (L.) Moench]

Abstract

Resistance to leaf blight in sorghum [<i>Sorghum bicolor</i> (L.) Moench] accession G-118 was found to segregate as a single dominant trait in a cross to susceptible cultivar, HC- 136. Molecular marker(s) linked to the locus for disease resistance was identified using simple sequence repeat (SSR) markers coupled with bulk segregant analysis. Genomic DNA from the parental cultivars and bulks were screened by PCR amplification with 50 simple sequence repeat primer pairs. Out of these, 38 SSR primers produced polymorphism between parents. After screening of these 38 SSRs with resistant and susceptible bulk, one SSR primer, Xtxp 309 produced a unique band of approximately 700 bp only in resistant parent and resistant bulk and a unique band of 450 bp only in susceptible parent and susceptible bulk. Upon screening with individual resistant and susceptible recombinant inbred lines (RILs), marker Xtxp 309 produced amplification in 23 of the 26 resistant RILs and no amplification was produced in any of the 25 susceptible RILs. The same marker Xtxp 309 produced amplification in 21 of the susceptible RILs and 3 of the resistant RILs of 450 bp band. This was found to be located at a distance of 3.12 cM away from the locus governing resistance to leaf blight which was considered to be closely linked and 7.95 cM away from the locus governing susceptibility to leaf blight. This marker may prove useful in MAS for gene introgression, plant genetic diagnostics and gene pyramiding for resistance <i>via</i> genetic transformation for disease resistance in plants.