Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/23136
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dc.contributor.authorDhanabalan, S-
dc.contributor.authorSivakumar, K-
dc.contributor.authorNarayanan, C Sathiya-
dc.date.accessioned2013-11-08T11:10:51Z-
dc.date.available2013-11-08T11:10:51Z-
dc.date.issued2013-10-
dc.identifier.issn0975-1017 (Online); 0971-4588 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/23136-
dc.description391-397en_US
dc.description.abstractThis paper demonstrates the effectiveness of optimizing multiple characteristics of electrical discharge machining (EDM) of Inconel 718 using copper electrodes having different shapes via Taguchi method-based Grey analysis. The modified algorithm adopted here is used successfully for both detraining the optimum settings of machining parameters and for combining multiple quality characteristic into one numerical value called Grey relational grade or rank. The essential parameters like peak current, pulse on time and pulse off time are chosen to conduct the experiments on multiple characteristics namely material removal rate (MRR), electrode wear rate (EWR), form tolerance namely straightness and orientation tolerance like perpendicularity and angularity. Then, ANOVA is used to find out the parameter which significantly affects the other parameters. The experimental results have shown that the machining performance on multiple characteristics in the EDM process is improved effectively through this approach.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.20(5) [October 2013]en_US
dc.subjectElectrical discharge machiningen_US
dc.subjectInconel 718en_US
dc.subjectTaguchi methoden_US
dc.subjectForm toleranceen_US
dc.subjectOrientation toleranceen_US
dc.subjectGrey relational analysisen_US
dc.titleOptimization of machining parameters of EDM while machining Inconel 718 for form tolerance and orientation toleranceen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.20(5) [October 2013]

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