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dc.contributor.authorAngra, S K-
dc.contributor.authorKumar, Parshant-
dc.contributor.authorBajpai, R P-
dc.date.accessioned2013-11-29T09:44:23Z-
dc.date.available2013-11-29T09:44:23Z-
dc.date.issued2001-08-
dc.identifier.issn0975-1017 (Online); 0971-4588 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/24362-
dc.description205-208en_US
dc.description.abstractDesigns of the subsystems of the Electron Cyclotron Resonance (ECR) plasma stream source at frequency 2.45 GHz are explored. The assembled machine on this design has been evaluated using Langmuir probe and etching of Si based compound. The plasma densities have been found to be above the critical value at this frequency and etching rates are compatible to the reported values.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.08(4) [August 2001]en_US
dc.titleDesign of electron cyclotron resonance based reactive ion etching systemen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.08(4) [August 2001]

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