X-ray diffraction studies of Ga₂Te₃

Abstract

Compound Ga₂Te₃ was prepared from the melt of initial elements of purity > 99.999% and characterized by powder and single crystal techniques of X-ray diffraction analysis. Powder X-ray pattern was obtained up to sin θ/λ =0.634Å^-1 and indexed. The powder data were corrected and explained on the findings of single crystal, obtained from the polycrystalline

ingot. The studies revealed that it crystallized in the cubic form of zinc blende structure with a_o=5.8984A, Z= 1.333, space group F43m and <i>D</i>_x<i>=</i>5.668 g/cc<i>. </i>Single crystals exhibited the property of cleavage along < 1<img src='http://www.niscair.res.in/jinfo/bar1.gif' border=0>1> and twinning a long < 1<img src='http://www.niscair.res.in/jinfo/bar1.gif' border=0>0 > directions.