Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/24413
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dc.contributor.authorRoy, M S-
dc.contributor.authorJaiswal, Pratibha-
dc.contributor.authorManmeeta-
dc.contributor.authorSaxena, Dhiraj-
dc.contributor.authorSharma, G D-
dc.date.accessioned2013-12-03T04:54:08Z-
dc.date.available2013-12-03T04:54:08Z-
dc.date.issued2000-10-
dc.identifier.urihttp://hdl.handle.net/123456789/24413-
dc.description282-286en_US
dc.description.abstractElectrical, impedance and photovoltaic measurements with a thin film of PMB doped PPy and undoped PPy , using sandwich between Ag and ITO are explained in terms of p-type semiconducting behaviour of PMB doped-PPy (PMB:PPy) film and by the formation of Schottky barrier with Ag and ohmic contact with ITO. At low voltage region Ohm's law is followed, while at high voltage region a space charge limited conduction is observed which is controlled by the exponential trap distribution. en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.07(5-6) [October-December 2000]en_US
dc.titleCharge conduction process and rectification effect in ITO/doped PPy/Ag deviceen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.07(5-6) [October-December 2000]

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