Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/24425
Full metadata record
DC FieldValueLanguage
dc.contributor.authorJayavel, P-
dc.contributor.authorKumar, J-
dc.contributor.authorRamasam, P-
dc.contributor.authorPremanand, R-
dc.date.accessioned2013-12-03T05:19:44Z-
dc.date.available2013-12-03T05:19:44Z-
dc.date.issued2000-10-
dc.identifier.urihttp://hdl.handle.net/123456789/24425-
dc.description340-343en_US
dc.description.abstractForward Voltage - Current (V- I) characteristics are generally used to investigate the Schottky barrier diode parameters, viz., barrier height, ideality factor and series resistance. This method requires a linear region (v > 3kT l q) in the In (I) vs V characteristics. When a metal-semiconductor con tact exhibits relatively high series resistance, it is difficult to determine a linear region in these forward characteristics. Therefore, one can also consider the reverse part of the VI characteristics.  Investigations are reponed here on Pd, Au and Ag/n-GaAs Schottky barrier diode parameters under the whole bias range of the VI characteristics. The theoretical and experimental results are compared and discussed. en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.07(5-6) [October-December 2000]en_US
dc.titleOn the evaluation of Schottky barrier diode parameters of Pd, Au and Ag/n-GaAsen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.07(5-6) [October-December 2000]

Files in This Item:
File Description SizeFormat 
IJEMS 7(5-6) 340-343.pdf777.71 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.