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dc.contributor.authorGoel, R-
dc.contributor.authorSil, A-
dc.contributor.authorAnand, H R-
dc.contributor.authorPrabhakar, S R-
dc.date.accessioned2013-12-03T05:23:12Z-
dc.date.available2013-12-03T05:23:12Z-
dc.date.issued2000-10-
dc.identifier.urihttp://hdl.handle.net/123456789/24426-
dc.description344-349en_US
dc.description.abstractGrain growth of ZnO in the system ZnO- Bi2O3(0.5 mol % )-SiO2 (0.4-0.6 mol % )-AI (0.0125 mol %) is reported here for the samples sintered at temperatures 1000-1250°C for 0.5-2 h. These results are compared with our previous studies onZnO- Bi2O3(0.5mol %)-SiO2 (0.4-0.6 mol %) in terms of kinetic grain growth expression : Gn- Gn o  = Ko t exp(-Q/RT). It has been observed that due to addition of AI, there is not much change in the values of grain growth exponent (n ). However, the n value decreases with increasing percentage of silica, whereas the activation energy (Q) increases. The impedance analysis shows that upon addition of even a small amount of AI, the grain resistance decreases to a large extent thereby improving the electrical characteristics by increasing the differential conductance between the grain and the grain boundary. en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.07(5-6) [October-December 2000]en_US
dc.titleGrain growth studies of Al doped ZnO-Bi2O3 - SiO2 (0.4-0.6 mol %) varistors en_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.07(5-6) [October-December 2000]

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