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dc.contributor.authorDhanasekaran, R-
dc.contributor.authorRamasamy, P-
dc.date.accessioned2013-12-03T05:24:51Z-
dc.date.available2013-12-03T05:24:51Z-
dc.date.issued2000-10-
dc.identifier.urihttp://hdl.handle.net/123456789/24427-
dc.description350-353en_US
dc.description.abstractIn the present communication, the recent developments in the growth kinetics of vapour phase epitaxy, liquid phase epitaxy and liquid phase electroepitaxy of III-V compound semiconductors have been reviewed. Investigations on the nucleation and growth mechanism of III-V binary, ternary and quaternary compounds grown from VPE are presented, compared with the available experimental results and there is a good agreement between them. Computer simulation technique has been used to construct the concentration profiles of the solute atoms present in front of the crystal-solution interface during the Liquid Phase Epitaxy and Liquid Phase Electroepitaxy of III-V binary, ternary and quaternary compound semiconductors. The growth rate of the materials and hence the thickness of the grown films have also been determined. en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.07(5-6) [October-December 2000]en_US
dc.titleGrowth kinetics of III -V compound semiconductorsen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.07(5-6) [October-December 2000]

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