Bandgap determination of chemically doped polyaniline materials from reflectance measurements

Abstract

<span style="font-size: 15.5pt;mso-bidi-font-size:8.5pt;font-family:" times="" new="" roman","serif""="">Spectroscopic techniques are very useful for characterizing semiconducting and conducting materials. The optical properties

<span style="font-size: 15.5pt;mso-bidi-font-size:8.5pt;font-family:" times="" new="" roman","serif""="">(specially reflection spectra) of polyaniline mix with metal Mn and Fe with different composition in bulk form were studied. The reflection spectra of these materials are recorded by a Hitachi spectro-photometer model (330), at room temperature, in the wavelength range 300-600 nm. From the analysis of reflection spectra, polyaniline mix with metal Mn and Fe have been found to have energy bandgap which decreases with increase of concentration of iron. An effort has also been made to study the structure

<span style="font-size: 15.5pt;mso-bidi-font-size:8.5pt;font-family:" times="" new="" roman","serif""="">form ation using XRD techniques.

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