Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/25524
Title: Rapidly decaying fast electron emission produced during fracture of organic and inorganic materials
Authors: Chandra, B P
Patel, N L
Rahangdale, S S
Patle, V K
Patel, R P
Issue Date: Nov-2000
Publisher: NISCAIR-CSIR, India
Abstract: The present paper reports the rapidly decaying fast electron emission produced during fracture of materials and models the dynamics of the process. The thermal population in the over-strained sites near the trip of moving cracks may generate excited carriers whose subsequent non-radiative recombination may release energy which may ionize the surface traps. The electrons leaving surface traps have low energies and their acceleration in the strong field of negatively charged surfaces may lead to the emission of fast electrons. Considering the basic mechanism of fast-electron emission, expressions are derived which are able to explain satisfactorily the temporal, thermal, charge, surface, humidity and other characteristics of the rapidly decaying fast electron emission produced during cleavage of crystals. After the fracture of materials, the rate of fast electron emission decays with two decay times, where the first decay time is controlled by the lifetime of excited species and the second decay time is controlled by the lifetime of charged carriers in the shallow surface traps. The lifetime of the excited species, lifetime of carriers in the shallow surface traps, and the velocity of cracks can be determined from the measurements of the rapidly decaying fast electron emission produced during fracture of materials.
Page(s): 771-778
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.38(11) [November 2000]

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