Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/25754
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dc.contributor.authorle, Li Ying-
dc.contributor.authorJi-ying, Huang-
dc.date.accessioned2014-01-16T05:55:43Z-
dc.date.available2014-01-16T05:55:43Z-
dc.date.issued2004-10-
dc.identifier.issn0975-105X (Online); 0367-8393 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/25754-
dc.description301-305en_US
dc.description.abstractThe analytic solution of scattered field by an ellipsoid of any shape is presented utilizing transformation of coordinates. The cross polarization discrimination (XPD) of electromagnetic waves induced by the ellipsoid is derived and simulated. Results show that XPD changes depend on ellipsoidal size, shape and observing location. The XPD varies smoothly with the shape at the forward points in comparison with that at the backward points. For a given shape, measuring in opposition to the incident direction provides the maximum in XPD.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.relation.ispartof92.60.Jq; 92.60.Mqen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJRSP Vol.33(5) [October 2004]en_US
dc.subjectCoordinate transformationen_US
dc.subjectEllipsoiden_US
dc.subjectScattering fielden_US
dc.titleAnalytic solution of scattering field and its characteristics for an ellipsoiden_US
dc.typeArticleen_US
Appears in Collections:IJRSP Vol.33(5) [October 2004]

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