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http://nopr.niscpr.res.in/handle/123456789/26446Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Babita | - |
| dc.contributor.author | Sharma, Divya K | - |
| dc.contributor.author | Satish | - |
| dc.contributor.author | Ansari, M A | - |
| dc.contributor.author | Saxena, A K | - |
| dc.date.accessioned | 2014-02-05T16:52:19Z | - |
| dc.date.available | 2014-02-05T16:52:19Z | - |
| dc.date.issued | 2014-02 | - |
| dc.identifier.issn | 0975-1084 (Online); 0022-4456 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/26446 | - |
| dc.description | 91-94 | en_US |
| dc.description.abstract | The need for precision measurement of dc current in the nanoampere and picoampere ranges is continuously increasing. The present paper discusses in detail the establishment of measurement facility for the first time at NPLI for these low level DC current ranges by using primary measurement standards of DC voltage and DC resistance. The same has been implemented by developing the fully automated system. The automation provides an efficient way for the low level current measurement as measuring sub nanoampere current manually is subjected to various sources of errors. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | JSIR Vol.73(02) [February 2014] | en_US |
| dc.subject | Precision | en_US |
| dc.subject | Current measurement | en_US |
| dc.subject | Electrometer | en_US |
| dc.subject | Automation | en_US |
| dc.title | A versatile automation program using LabVIEW for low dc current measurement | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | JSIR Vol.73(02) [February 2014] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JSIR 73(2) 91-94.pdf | 120.52 kB | Adobe PDF | View/Open |
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