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http://nopr.niscpr.res.in/handle/123456789/27135| Title: | Chemically prepared Cd1-xZnxSe thin films: A correlation between compositional and structural analysis |
| Authors: | Sutrave, S Shahane, S Patil, V B Deshmukh, L P |
| Issue Date: | May-1999 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | The structural changes caused by the deliberate addition of Zn2+ into the lattice of CdSe have been investigated . Various Cd1-xZnxSe (0≤ x ≤1) thin film structures were fabricated on the glass substrates at a deposition temperature of 70.2°C. The film composition was determined and compared with the bath composition. A non-linear relation has been observed between them. The XRD studies revealed a mixed structure (hexagonal and cubic) for CdSe whereas ZnSe films were cubic only. The structure of the Cd1-xZnxSe films is compositi on-dependent. It has been observed that Cd1-xZnxSe films are hexagonal wurtizite in structure for 0≤ x ≤0.2 wherein Zn2+ enters into the lattice of CdSe as a dopant. For 0.2≤ x ≤0.7 The films have been composed of the mixed phases of CdSe nncl ZnSe. It is interesting to note that CdSe and ZnSe form a solid solution for 0.7≤x≤1 which has indicated by the change in colour of the sample and shift in the peak position through d-increasing typically from 3.279 to 3.334Å. The lattice parameter (LP) varied continuously from 5.681 to 5.776Å for this range . Some reflections of SeO2, elemental Zn and ZnO have also been detected for higher x-values. |
| Page(s): | 384-394 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Appears in Collections: | IJPAP Vol.37(05) [May 1999] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJPAP 37(5) 384-394.pdf | 1.39 MB | Adobe PDF | View/Open |
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