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http://nopr.niscpr.res.in/handle/123456789/29641Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Vishwakarrna, S R | - |
| dc.contributor.author | Prasad, S | - |
| dc.contributor.author | Prasad, H C | - |
| dc.contributor.author | Misra, M | - |
| dc.date.accessioned | 2014-11-03T10:28:03Z | - |
| dc.date.available | 2014-11-03T10:28:03Z | - |
| dc.date.issued | 1998-10 | - |
| dc.identifier.issn | 0975-1017 (Online); 0971-4588 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/29641 | - |
| dc.description | 267-270 | en_US |
| dc.description.abstract | CdTe thin films were deposited on glass substrates using electron beam evaporation technique. The cadmium enriched starting materials, as (1-x) % Cd and x% Te where x varies from 20% to 45%, were used for fabrication of thin films. The variations of structural properties with composition of Cd and Te in starting materials have been studied. Films were characterized by using XRD and SEM techniques. In the composition range 20% ≤ x ≤ 45% CdTe films are n-type and polycrystalline. Scanning electron microscopic studies of the films indicate that the grains are fine and with small size of crystallites. X-ray diffract grams show that the grain size of CdTe films varies from 1.33 to 1.57 Å. It has been observed that the cubic structure of CdTe films is more responsible for their high conductivity. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | IJEMS Vol.05(5) [October 1998] | en_US |
| dc.title | Structural properties of electron-beam evaporated CdTe films | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJEMS Vol.05(5) [October 1998] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJEMS 5(5) 267-270.pdf | 1.18 MB | Adobe PDF | View/Open |
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