Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/29916
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dc.contributor.authorHusain, Rahat-
dc.date.accessioned2014-11-13T04:39:05Z-
dc.date.available2014-11-13T04:39:05Z-
dc.date.issued1995-12-
dc.identifier.issn0975-1017 (Online); 0971-4588 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/29916-
dc.description286-290en_US
dc.description.abstractThe paper presents a metrological technique for surveillance and calibration of similar standard resistors taken in group, at laboratories ranked next to the national level laboratories, based on calculation of eigen values and eigen vector of the measurement data matrix. The technique employs the various cross-products of measurement ratio data and provides a new mean of group calibration.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.02(6) [December 1995]en_US
dc.titleSurveillance and calibration of standard resistors at a Metrological laboratoryen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.02(6) [December 1995]

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