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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Biswas, S S | - |
| dc.contributor.author | Dixit, V S | - |
| dc.contributor.author | Murty, P S | - |
| dc.date.accessioned | 2015-03-26T06:35:31Z | - |
| dc.date.available | 2015-03-26T06:35:31Z | - |
| dc.date.issued | 1994-05 | - |
| dc.identifier.issn | 0975-0991 (Online); 0971-457X (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/31200 | - |
| dc.description | 191-193 | en_US |
| dc.description.abstract | Using DC arc optical emission spectrometry, B and Cd have been estimated in MgF2 in the concentration range, 1-20 ppm. An on-line background correction procedure has been developed to obtain net peak intensities for B249.77 nm, Cd 228.80 nm and 241.87 nm (internal standard) lines. The background corrected peak intensities provided linear calibration plots. The mean relative standard deviation of the method is found to be 11.1 % for B and 9.8% for Cd. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | IJCT Vol.01(3) [May 1994] | en_US |
| dc.title | Determination or B and Cd in MgF2 by DC arc optical emission spectrometry with on-line background correction approach | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJCT Vol.01(3) [May 1994] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJCT 1(3) 191-193.pdf | 240.57 kB | Adobe PDF | View/Open |
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