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http://nopr.niscpr.res.in/handle/123456789/32292Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Das, R P | - |
| dc.contributor.author | Bhattacharya, M | - |
| dc.contributor.author | Jatua, T | - |
| dc.date.accessioned | 2015-09-15T05:30:36Z | - |
| dc.date.available | 2015-09-15T05:30:36Z | - |
| dc.date.issued | 1995-03 | - |
| dc.identifier.issn | 0975-1025 (Online); 0971-0426 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/32292 | - |
| dc.description | 1-5 | en_US |
| dc.description.abstract | An instrument developed for the evaluation of evenness of jute yarn diameter and thick and thin places employing microprocessor-based technology has been described. The instrument is superior to the existing one in respect of its direct computation and memory capability with digital read-out, giving more accurate results. The values of irregularity parameters (e.g. CV%, thick places and thin places) are all evaluated over the same test piece of the sample yarn. The special features include the programmable selection of test length and the thin place counting facility. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | IJFTR Vol.20(1) [March 1995] | en_US |
| dc.subject | Jute yarn | en_US |
| dc.subject | Microprocessor | en_US |
| dc.subject | Thick place | en_US |
| dc.subject | Thin place | en_US |
| dc.subject | Yarn diameter | en_US |
| dc.subject | Yarn evenness tester | en_US |
| dc.title | Microprocessor-based yarn evenness tester and thick and thin place counter | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJFTR Vol.20(1) [March 1995] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJFTR 20(1) 1-5.pdf | 926.89 kB | Adobe PDF | View/Open |
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