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http://nopr.niscpr.res.in/handle/123456789/32655Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kothari, V K | - |
| dc.contributor.author | Iype, C | - |
| dc.contributor.author | Abadi, A | - |
| dc.date.accessioned | 2015-10-09T10:50:27Z | - |
| dc.date.available | 2015-10-09T10:50:27Z | - |
| dc.date.issued | 1989-09 | - |
| dc.identifier.issn | 0975-1025 (Online); 0971-0426 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/32655 | - |
| dc.description | 103-108 | en_US |
| dc.description.abstract | A low-cost conversion of a conventional tensile tester, the Instron Model TM-M, into a computer-controlled tester is discussed. The advantages of such a conversion like inertia free data recording and automatic and instant analysis of data are highlighted. The necessary hardware modifications and the methods of data acquisition and data analysis, which form the basis of the software developed, are described. A typical report printed out at the end of testing and the average load-extension curve based on a number of tests are also given. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights |  CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | IJFTR Vol.14(3) [September 1989] | en_US |
| dc.subject | Load-extension curves | en_US |
| dc.subject | Microprocessor-controlled data acquisition | en_US |
| dc.subject | analysis | en_US |
| dc.subject | Tensile tester | en_US |
| dc.title | Microprocessor-controlled data acquisition and analysis on conven tensile testers | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJFTR Vol.14(3) [September 1989] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJFTR 14(3) 103-108.pdf | 1.34 MB | Adobe PDF | View/Open |
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