Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/36030
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dc.contributor.authorPrasad, D S V V D-
dc.contributor.authorRao, P V S Rama-
dc.date.accessioned2016-10-24T09:54:00Z-
dc.date.available2016-10-24T09:54:00Z-
dc.date.issued1993-12-
dc.identifier.issn0975-105X (Online); 0367-8393 (Print)-
dc.identifier.urihttp://nopr.niscair.res.in/handle/123456789/36030-
dc.description391-396en_US
dc.description.abstractPolarization rotation data (l36 MHz)recorded from the geostationary satellites ETS-Il and SIRIO at a low latitude station, Waltair (17.7°N,83.3°E)during high (1978-79)and low(1984-85)sunspot number years have been used to study the day-to-day variability of the ionospheric electron content (lEC). The ratio of the standard deviation of daily IEC values to the mean IEC values has been used as a measure of the variability. The daytime ratios are reasonably constant and independent of season during both the sunspot number years. The nighttime ratios are higher (20-80%) during high solar activitv period compared to those (15-30%) of low solar activity period. A correlative study is made on the day-to-day variability in IECmax with possible causative factors, such as solar 10.7cm flux, electrojet strength (Δ H) and magnetic index (Ap) during the low solar activity period. The IEC at Waltair shows a linearly increasing trend with 10.7 cm flux during three different seasons and with the electrojet strength only in summer, while it does not seem to depend on the magnetic index. However, the percentage variations in the diurnal lEC, when considered separately for magnetically quiet and disturbed days during three different seasons of low solar activity period, show a clear ‘mirror-image’ behavior only during summer.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJRSP Vol.22(6) [December 1993]en_US
dc.titleDay-to-day variability of ionospheric electron content over Waltairen_US
dc.typeArticleen_US
Appears in Collections:IJRSP Vol.22(6) [December 1993]

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