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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Vetrivel, Santhakumaran | - |
| dc.contributor.author | Ramesh, Sengottuvelu | - |
| dc.date.accessioned | 2018-03-08T10:14:38Z | - |
| dc.date.available | 2018-03-08T10:14:38Z | - |
| dc.date.issued | 2017-12 | - |
| dc.identifier.issn | 0975-1017 (Online); 0971-4588 (Print) | - |
| dc.identifier.uri | http://nopr.niscair.res.in/handle/123456789/43710 | - |
| dc.description | 455-460 | en_US |
| dc.description.abstract | In this present study, synthesis and characterization of copper (Cu) nanoparticles have been reported. The low-cost, effective and eco-friendly top down technique is adopted for the synthesis of Cu nano particles from machined Cu chips. The copper chips are treated in a high energy planetary ball mill using tungsten (W) grinding ball media for 25 h and 50 h at 300 rpm under the pure argon gas as the process control agent (PCA) for avoiding oxidation. The ball to powder weight ratio is maintained at 10:1. The obtained samples are characterized using ultra violet spectra, visible spectroscopy (UV-vis), X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDAX). From the XRD results phase evolution, d-spacing, dislocation density, peak indexing remarks and particle size are determined. The XRD study shows that the prepared samples are holo crystalline in nature. X-ray peak analysis is carried out to calculate the lattice strain from Williamson-Hall (W-H) plot. The optical properties of the milled Cu sample are studied using UV-Vis spectra. The SEM images confirm the nanostructure of prepared copper nanoparticles. The EDAX results reveal that the samples are in pure form. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | NISCAIR-CSIR, India | en_US |
| dc.rights | CC Attribution-Noncommercial-No Derivative Works 2.5 India | en_US |
| dc.source | IJEMS Vol.24(6) [December 2017] | en_US |
| dc.subject | Ball milling | en_US |
| dc.subject | Peak indexing | en_US |
| dc.subject | W-H plot | en_US |
| dc.subject | Dislocation density | en_US |
| dc.subject | SEM | en_US |
| dc.title | Modernization of copper chips synthesized by top down approach in addition to W-H plot, EDAX and extensive X-ray diffraction studies | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJEMS Vol.24(6) [December 2017] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJEMS 24(6) 455-460.pdf | 499.35 kB | Adobe PDF | View/Open |
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