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dc.contributor.authorVetrivel, Santhakumaran-
dc.contributor.authorRamesh, Sengottuvelu-
dc.date.accessioned2018-03-08T10:14:38Z-
dc.date.available2018-03-08T10:14:38Z-
dc.date.issued2017-12-
dc.identifier.issn0975-1017 (Online); 0971-4588 (Print)-
dc.identifier.urihttp://nopr.niscair.res.in/handle/123456789/43710-
dc.description455-460en_US
dc.description.abstractIn this present study, synthesis and characterization of copper (Cu) nanoparticles have been reported. The low-cost, effective and eco-friendly top down technique is adopted for the synthesis of Cu nano particles from machined Cu chips. The copper chips are treated in a high energy planetary ball mill using tungsten (W) grinding ball media for 25 h and 50 h at 300 rpm under the pure argon gas as the process control agent (PCA) for avoiding oxidation. The ball to powder weight ratio is maintained at 10:1. The obtained samples are characterized using ultra violet spectra, visible spectroscopy (UV-vis), X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDAX). From the XRD results phase evolution, d-spacing, dislocation density, peak indexing remarks and particle size are determined. The XRD study shows that the prepared samples are holo crystalline in nature. X-ray peak analysis is carried out to calculate the lattice strain from Williamson-Hall (W-H) plot. The optical properties of the milled Cu sample are studied using UV-Vis spectra. The SEM images confirm the nanostructure of prepared copper nanoparticles. The EDAX results reveal that the samples are in pure form.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJEMS Vol.24(6) [December 2017]en_US
dc.subjectBall millingen_US
dc.subjectPeak indexingen_US
dc.subjectW-H ploten_US
dc.subjectDislocation densityen_US
dc.subjectSEMen_US
dc.titleModernization of copper chips synthesized by top down approach in addition to W-H plot, EDAX and extensive X-ray diffraction studiesen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.24(6) [December 2017]

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