Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/46534
Title: Characterization of catalyst surface by ESCA
Authors: Kaushik, Vijay Kumar
Issue Date: Nov-1990
Publisher: NISCAIR-CSIR, India
Abstract: X-ray photoelectron spectroscopy is a highly surface sensitive technique used for characterization of catalyst surfaces. The information obtained by this technique is very crucial in understanding catalyst, its deactivation and several other aspects of surface. We have extensively used ESCA in our surface science laboratory. The present paper deals with the application of ESCA to several catalyst systems, illustrated with specific examples. Besides, some emerging areas of surface science in the field of catalyst characterization will be highlighted.
Page(s): 1098-1100
ISSN: 0975-0975(Online); 0376-4710(Print)
Appears in Collections:IJC-A Vol.29A(11) [November 1990]

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