Please use this identifier to cite or link to this item:
http://nopr.niscpr.res.in/handle/123456789/49768| Title: | Low energy ion beam study on Co/CoO thin films |
| Authors: | Kumar, Deepak Bhattacharyya, A S |
| Keywords: | Low energy ion beam (LEIB);FM/AFM system;SRIM;Dewetting |
| Issue Date: | Aug-2019 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | Computer simulation using SRIM software has been done for ion beam irradiation of different metal ions on Co/CoO thin film which is an FM/AFM system. The films have been experimentally deposited by magnetron sputtering and subjected to low energy ion beams (LEIB) of different energies and fluences. The variation of Si ion energy led to different ion distribution profiles which could be correlated with the morphological changes like dewetting occurring at the surface. Such phenomenon is potentially important for making spintronic devices in future. |
| Page(s): | 605-606 |
| ISSN: | 0975-0959 (Online); 0301-1208 (Print) |
| Appears in Collections: | IJPAP Vol.57(08) [August 2019] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJPAP 57(8) 605-606.pdf | 1.66 MB | Adobe PDF | View/Open |
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