Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/49777
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dc.contributor.authorSavadi, Varun Vijay-
dc.contributor.authorMajeed, Ishfaq-
dc.contributor.authorShuaib, Mohd-
dc.contributor.authorSharma, Vijay Raj-
dc.contributor.authorYadav, Abhishek-
dc.contributor.authorSingh, Devendra P-
dc.contributor.authorSingh, Pushpendra P-
dc.contributor.authorUnnati-
dc.contributor.authorSharma, Manoj Kumar-
dc.contributor.authorKumar, Rakesh-
dc.contributor.authorSingh, B P-
dc.contributor.authorPrasad, R-
dc.date.accessioned2019-08-13T06:22:13Z-
dc.date.available2019-08-13T06:22:13Z-
dc.date.issued2019-08-
dc.identifier.issn0975-0959 (Online); 0301-1208 (Print)-
dc.identifier.urihttp://nopr.niscair.res.in/handle/123456789/49777-
dc.description566-569en_US
dc.description.abstractIn the present work, the residual activity induced in 181Ta targets bombarded with 16O beam in the energy range ≈70-100 MeV have been measured. Stacked foil activation has been employed to measure the cross-sections of the several radio-isotopes populated through different nuclear reaction across various energies. Yields of the radio-isotopic products such as 194,193,192Tl, 193,192Hg, 192,191,190Au have been obtained with the help of the characteristic γ-lines. Further, calibration curves are deduced by observing remnant activity induced across different depths in the target material. As a result an attempt has been made to employ thin layer activation technique with increased sensitivity for the study of surface wear.en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJPAP Vol.57(08) [August 2019]en_US
dc.subjectActivation techniqueen_US
dc.subjectThin layer activationen_US
dc.subjectSurface lossen_US
dc.subjectIon beam nuclear reactionen_US
dc.subjectCorrosionen_US
dc.subjectErosionen_US
dc.titleThin layer activation analysis of 16O induced reactions for surface wear studies in some natural isotopesen_US
dc.typeArticleen_US
Appears in Collections:IJPAP Vol.57(08) [August 2019]

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