Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/50115
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dc.contributor.authorSetty, M. S.-
dc.contributor.authorSinha, A. P. B.-
dc.date.accessioned2019-08-28T05:33:00Z-
dc.date.available2019-08-28T05:33:00Z-
dc.date.issued1981-04-
dc.identifier.issn0975-0975(Online); 0376-4710(Print)-
dc.identifier.urihttp://nopr.niscair.res.in/handle/123456789/50115-
dc.description322-325en_US
dc.language.isoen_USen_US
dc.publisherNISCAIR-CSIR, Indiaen_US
dc.rights CC Attribution-Noncommercial-No Derivative Works 2.5 Indiaen_US
dc.sourceIJC-A Vol.20A(04) [April 1981]en_US
dc.titleThermogravimetric Analysis of Thick Film Material of Vanadium Phosphate Semiconducting Glassen_US
dc.typeArticleen_US
Appears in Collections:IJC-A Vol.20A(04) [April 1981]

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