Dielectric properties of lead zirconatetitanate

Abstract

Ferroelectric lead zirconate titanate (PZT) thin films deposited on metal foil substrates are suitable for developing a wide range of applications. PZT were prepared by mixed oxide method at 1100°C. Crystalline nature of the synthesized PZT has been confirmed by X-ray powder diffraction studies. Dielectric measurement shows that decrease in dielectric constant with increase in temperature. The dielectric loss was found to be very small and decreasing with frequency, also above 300°C. The increase of dielectric constant observed at high temperatures and low frequencies in the paraelectric state are explained.