Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/61369
Full metadata record
DC FieldValueLanguage
dc.contributor.authorL V, Narasimha Prasad-
dc.contributor.authorDokku, Durga Bhavani-
dc.contributor.authorTalasila, Sri Lakshmi-
dc.contributor.authorTumuluru, Praveen-
dc.date.accessioned2023-02-08T05:38:05Z-
dc.date.available2023-02-08T05:38:05Z-
dc.date.issued2023-02-
dc.identifier.issn0022-4456 (Print); 0975-1084 (Online)-
dc.identifier.urihttp://nopr.niscpr.res.in/handle/123456789/61369-
dc.description171-177en_US
dc.description.abstractA casting defect is an expendable abnormality and the most undesirable thing in the metal casting process. In Casting Defect Detection, deep learning based on Convolution Neural Network (CNN) models has been widely used, but most of these models require a lot of processing power. This work proposes a low-power ShuffleNet V2-based Transfer Learning model for defect identification with low latency, easy upgrading, increased efficiency, and an automatic visual inspection system with edge computing. Initially, various image transformation techniques were used for data augmentation on casting datasets to test the model flexibility in diverse casting. Subsequently, a pre-trained lightweight ShuffleNetV2 model is adapted, and hyperparameters are fine-tuned to optimize the model. The work results in a lightweight, adaptive, and scalable model ideal for resource-constrained edge devices. Finally, the trained model can be used as an edge device on the NVIDIA Jetson Nano-kit to speed up detection. The measures of precision, recall, accuracy, and F1 score were utilized for model evaluation. According to the statistical measures, the model accuracy is 99.58%, precision is 100%, recall is 99%, and the F1-Score is 100 %.en_US
dc.language.isoenen_US
dc.publisherNIScPR-CSIR,Indiaen_US
dc.sourceJSIR Vol.82(02) [February 2023]en_US
dc.subjectEdge Computingen_US
dc.subjectIndustrial Internet of Thingsen_US
dc.subjectNVIDIA Jetson Nano-kiten_US
dc.subjectShuffleNetV2en_US
dc.titleHyper Parameter Optimization for Transfer Learning of ShuffleNetV2 with Edge Computing for Casting Defect Detectionen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.56042/jsir.v82i2.70250en_US
Appears in Collections:JSIR Vol.82(02) [February 2023]

Files in This Item:
File Description SizeFormat 
JSIR 82(02) 171-177.pdf983.73 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.