Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/62284
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dc.contributor.authorMariappan, R.-
dc.contributor.authorDinagaran, S.-
dc.contributor.authorSrinivasan, P.-
dc.contributor.authorVijayakumar, S.-
dc.date.accessioned2023-07-11T05:33:54Z-
dc.date.available2023-07-11T05:33:54Z-
dc.date.issued2023-07-
dc.identifier.issn0975-0991 (Online); 0971-457X (Print)-
dc.identifier.urihttp://nopr.niscpr.res.in/handle/123456789/62284-
dc.description483-491en_US
dc.description.abstractThe electrical impedance analysis of the ZnO films has been performed using complex impedance spectroscopy in the frequency range from 100 Hz to 1 MHz with temperature change from 70 to 175℃. Combined impedance and modulus plots have been used to analyse the sample behaviour as a function of frequency at different temperatures. Temperature dependence of ac conductivity indicates that the electrical conduction in the material is a thermally activated process. The frequency dependence of the ac conduction activation energy is found to obey a mathematical formula. It is concluded that the conductivity mechanism in the ZnO sensor is controlled by surface reaction. The operating temperature of the ZnO gas sensor is 175℃. The impedance spectrum also exhibited a decreased semicircle radius as the ammonia concentration is increased from 50 to 500 ppm. In addition, the impedance spectrum also exhibited a decreased semicircle radius with the exposure time increase from 0 to 20 min thereafter slightly increased. Impedance spectroscopy analysis has shown that the resistance variation due to grain boundaries significantly contributed to the gas sensor characteristics.en_US
dc.language.isoenen_US
dc.publisherNIScPR-CSIR,Indiaen_US
dc.sourceIJCT Vol.30(4) [July 2023]en_US
dc.subjectZnO deviceen_US
dc.subjectImpedance analysisen_US
dc.subjectAmmonia sensoren_US
dc.titleElectrical impedance analysis of ZnO thin films for ammonia gas sensorsen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.56042/ijct.v30i4.71226en_US
Appears in Collections:IJCT Vol.30(4) [July 2023]

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