Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/62410
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dc.contributor.authorBrar, Amrinder Singh-
dc.contributor.authorSingh, Kawaljeet-
dc.date.accessioned2023-08-09T04:21:34Z-
dc.date.available2023-08-09T04:21:34Z-
dc.date.issued2023-08-
dc.identifier.issn0022-4456 (Print); 0975-1084 (Online)-
dc.identifier.urihttp://nopr.niscpr.res.in/handle/123456789/62410-
dc.description861-869en_US
dc.description.abstractThe global vegetable market demands rigorous quality analysis of potato crops to define their reasonable market price. Highly accurate machine learning-based automated potato defect detection systems are necessary for this rising global market. On the other hand, artificial illuminating lamps used in these machine learning systems are decisive in determining their defect detection accuracy. Artificial illuminating lamps used in these machine learning systems should provide a perception of color that is as similar as possible to natural potato color. This paper analysed potato skin color measuring accuracy of seven different illumination lamps (L01 to L07). The analysis used ten potato samples with various defects, including one healthy potato. Experimental results proved that the lowest Δ𝐸∗was obtained when the Compact Fluorescent lamp 45W, 6500 Correlated Color Temperature (CCT) (L1) was used as an illuminating lamp. The proposed experimental study will help to develop machine learning methodologies in future research by generating higher accuracies for potato defect detection using an L01-type illuminating lamp.en_US
dc.language.isoenen_US
dc.publisherNIScPR-CSIR,Indiaen_US
dc.sourceJSIR Vol.82(08) [August 2023]en_US
dc.subjectComputer visionen_US
dc.subjectFood qualityen_US
dc.subjectImage acquisitionen_US
dc.subjectMeasurement and instrumentationen_US
dc.subjectStandardizationen_US
dc.titleInfluence of Illumination on Color based Potato Defect Detectionen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.56042/jsir.v82i08.3140en_US
Appears in Collections:JSIR Vol.82(08) [August 2023]

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