Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/68437
metadata.dc.identifier.doi: https://doi.org/10.56042/ijpap.v64i9.28951
Title: Polar Resistors Asymmetric Semiconductor Structures as Linear Resistors with Different Resistances for Opposite Polarities
Authors: N Roy Choudhury, Aditya
Keywords: Polar resistance;Polarity-dependent resistance;Semiconductor INI structures;Semiconductor NININ structures
Issue Date: Sep-2026
Publisher: NIScPR-CSIR, India
Abstract: Passive, two-terminal resistors, with linear current voltage relationships, but exhibiting different resistances for opposite polarities are introduced in this paper. Such resistors change their resistance when current direction through them changes. These are named polar resistors. Such polar resistance is observed in asymmetric semiconductor INI structures, where I is an abbreviation for intrinsic, and N is for n-type doped. Polar resistance is not material specific. Both Silicon and Gallium Arsenide polar resistors were simulated in this work. In a three-layered INI structure, for certain thicknesses of the intrinsic layers, it is observed that for positive voltage, voltage drops significantly across one intrinsic layer, and for negative voltage, voltage drops significantly across the other intrinsic layer. With different I-layer thicknesses polar resistance is achieved. A background mobile electronic concentration of 1011/cc and 1012/cc were assumed for Si, due to background doping, and 107/cc and 108/cc were assumed for GaAs. Metallic ohmic contacts to semiconductor intrinsic layers are difficult to fabricate. So doped n-type CdS and SnO2 were used as contact enabling layers to Si and GaAs respectively. This implies the structure is NININ; i.e. N-CdS/I-Si/N-Si/I-Si/N-CdS and N-SnO2/I-GaAs/N-GaAs/I-GaAs/N-SnO2. In such devices, between -1V and +1V, polar resistance is observed and a rectification ratio up to 10 are demonstrated. The roles of the middle N layer and the n-type contact enabling layers are also discussed.
Page(s): 984-997
ISSN: 0975-1041 (Online) ; 0019-5596 (Print)
Appears in Collections:IJPAP Vol.64(09) [September 2026]

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