Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/8238
Full metadata record
DC FieldValueLanguage
dc.contributor.authorChoudhary, N-
dc.contributor.authorKumar, A-
dc.date.accessioned2010-04-21T09:24:40Z-
dc.date.available2010-04-21T09:24:40Z-
dc.date.issued2006-01-
dc.identifier.issn0975-1041 (Online); 0019-5596 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/8238-
dc.description62-65en_US
dc.description.abstractTemperature dependence of dielectric constant (e')and dielectric loss (e") are studied in glassy  Se70Te30-xAgxwhere x is varied from 0 to 10 in the frequency range 1 to 10 kHz and temperature range 300-350 K. The results indicate that the dielectric dispersion exists in the above frequency and temperature range. Loss peaks in  e" versus T curve could be observed in ternary Se70Te30-xAgx alloys. However, such loss peaks could not be observed in binary Se70Te30 alloy, which indicates that Ag incorporation in binary system, is responsible for such behaviour. This is explained in terms of [(D-) (Ag+)] dipoles which otherwise were not present in the undoped samples.en_US
dc.language.isoen_USen_US
dc.publisherCSIRen_US
dc.relation.ispartofseriesG01R27/26en_US
dc.sourceIJPAP Vol.44(01) [January 2006]en_US
dc.subjectChalcogenide glassesen_US
dc.subjectDielectric relaxationen_US
dc.subjectTernary alloysen_US
dc.titleDielectric relaxation in glassy Se70Te30-xAgxen_US
dc.typeArticleen_US
Appears in Collections:IJPAP Vol.44(01) [January 2006]

Files in This Item:
File Description SizeFormat 
IJPAP 44(1) 62-65.pdf122.29 kBAdobe PDFView/Open


Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.