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dc.contributor.authorSoni, P H-
dc.contributor.authorOtia, J R-
dc.contributor.authorDesai, C F-
dc.date.accessioned2010-06-01T06:02:12Z-
dc.date.available2010-06-01T06:02:12Z-
dc.date.issued2004-06-
dc.identifier.issn0975-1017 (Online); 0971-4588 (Print)-
dc.identifier.urihttp://hdl.handle.net/123456789/9280-
dc.description221-223en_US
dc.description.abstractBi2Te2.8Se0.2 thin films were grown using the thermal evaporation technique on a (001) face of NaCl crystal as a substrate at room temperature. The optical absorption was measured in the wave number range 500-4000 cm-1. From the optical absorption data the band gap has been evaluated and studied as a function of the film thickness and deposition temperature. The data indicate absorption through direct interband transition with a band gap of around 0.24 eV.en_US
dc.language.isoen_USen_US
dc.publisherCSIRen_US
dc.relation.ispartofseriesInt. Cl.7 H01 L 29/18en_US
dc.sourceIJEMS Vol.11(3) [June 2004]en_US
dc.titleOptical band gap of Bi2Te2.8Se0.2 thin filmsen_US
dc.typeArticleen_US
Appears in Collections:IJEMS Vol.11(3) [June 2004]

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