Please use this identifier to cite or link to this item:
http://nopr.niscpr.res.in/handle/123456789/9280Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Soni, P H | - |
| dc.contributor.author | Otia, J R | - |
| dc.contributor.author | Desai, C F | - |
| dc.date.accessioned | 2010-06-01T06:02:12Z | - |
| dc.date.available | 2010-06-01T06:02:12Z | - |
| dc.date.issued | 2004-06 | - |
| dc.identifier.issn | 0975-1017 (Online); 0971-4588 (Print) | - |
| dc.identifier.uri | http://hdl.handle.net/123456789/9280 | - |
| dc.description | 221-223 | en_US |
| dc.description.abstract | Bi2Te2.8Se0.2 thin films were grown using the thermal evaporation technique on a (001) face of NaCl crystal as a substrate at room temperature. The optical absorption was measured in the wave number range 500-4000 cm-1. From the optical absorption data the band gap has been evaluated and studied as a function of the film thickness and deposition temperature. The data indicate absorption through direct interband transition with a band gap of around 0.24 eV. | en_US |
| dc.language.iso | en_US | en_US |
| dc.publisher | CSIR | en_US |
| dc.relation.ispartofseries | Int. Cl.7 H01 L 29/18 | en_US |
| dc.source | IJEMS Vol.11(3) [June 2004] | en_US |
| dc.title | Optical band gap of Bi2Te2.8Se0.2 thin films | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | IJEMS Vol.11(3) [June 2004] | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJEMS 11(3) 221-223.pdf | 58.16 kB | Adobe PDF | View/Open |
Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.