Browsing by Author Jayanth, C V
Showing results 1 to 1 of 1
| Title | Author(s) | Source | Page(s) |
|---|---|---|---|
| Characterization of white and red teff grains using X-ray technique | Hagos, Kiros; Jayanth, C V; Somashekar, R | JSIR Vol.71(08) [August 2012] | 534-538 |