Please use this identifier to cite or link to this item:
http://nopr.niscpr.res.in/handle/123456789/14522| Title: | Characterization of white and red teff grains using X-ray technique |
| Authors: | Hagos, Kiros Jayanth, C V Somashekar, R |
| Keywords: | Microwave radiation;Solvent treatment;White and red teff grains;X-ray studies |
| Issue Date: | Aug-2012 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | This study presents X-ray studies to investigate effect of microwave radiation and solvent treatment of white and red teff grains normally grown in Ethiopia. Studies were correlated for a better understanding of these grains. |
| Page(s): | 534-538 |
| ISSN: | 0975-1084 (Online); 0022-4456 (Print) |
| Appears in Collections: | JSIR Vol.71(08) [August 2012] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JSIR 71(8) 534-538.pdf | 172.61 kB | Adobe PDF | View/Open |
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