Please use this identifier to cite or link to this item:
http://nopr.niscpr.res.in/handle/123456789/1331| Title: | Achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas |
| Authors: | Hsieh, K-L |
| Keywords: | Backpropagation neural network model;Critical areas;Critical layers;Liquid crystal displays (LCDs);Stepwise regression technique |
| Issue Date: | Nov-2007 |
| Publisher: | CSIR |
| Abstract: | In this study, a procedure is proposed to address achieving yield construction and process analysis in TFT-LCD industry based on critical layers and areas. Besides, an illustrative case owing to TFT-LCD manufacturer at Tainan Science Park in Taiwan has been applied to verify rationality and feasibility of proposed procedure. |
| Page(s): | 891-897 |
| ISSN: | 0022-4456 |
| Appears in Collections: | JSIR Vol.66(11) [November 2007] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| JSIR 66(11) (2007) 891-897.pdf | 93.64 kB | Adobe PDF | View/Open |
Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.