Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/24423
Title: Growth and characterization of Bi12SiO20 and Bi12GeO20 crystals
Authors: Kumaragurubaran, S
Babu, S Moorthy
Subramanian, C
Ramasamy, P
Issue Date: Oct-2000
Publisher: NISCAIR-CSIR, India
Abstract: The photorefractive bismuth silicon oxide (Bi12SiO20) and bismuth germanium oxide (Bi12SiO20) crystals were synthesized and Czochralski growth performed in a resistive heating furnace having a vertical temperature gradient of 20°C/cm. Several crystals with <100> orientation were grown. The effect of rotation rate was studied from the fluid flow point of view and the growth parameters were optimised to yield crystals free from the central core and bubbles. The UV-VIS spectra revealed optical absorption edge and transmission in these crystals. The quality of the crystals was analysed by chemical etching studies. The Vickers microhardness studies were also carried out on the (100) plane of the SSO crystal.
Page(s): 331-335
Appears in Collections:IJEMS Vol.07(5-6) [October-December 2000]

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