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http://nopr.niscpr.res.in/handle/123456789/25484| Title: | Conduction mechanism in CuxFe3-xO4 |
| Authors: | Patil, A N Mahajan, R P Patankar, K K Ghatage, A K Mathe, V L Patil, S A |
| Issue Date: | Sep-2000 |
| Publisher: | NISCAIR-CSIR, India |
| Abstract: | The electrical resistivity and thermoelectric power measurements as a function of temperature are carried out for the system CuxFe3-xO4 with x = 1, 0.8, 0.6, 0.4 and 0.2. The lattice constants of the phases are evaluated from X- ray powder data. The thermoelectric powder measurement indicates that the samples are n-type semiconductor and the conduction mechanism is associated with the polaron hopping. The dielectric behaviour is found to be abnormal and this is explained on the basis of Koop's model. |
| Page(s): | 651-656 |
| ISSN: | 0975-1041 (Online); 0019-5596 (Print) |
| Appears in Collections: | IJPAP Vol.38(09) [September 2000] |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| IJPAP 38(9) 651-656.pdf | 912.78 kB | Adobe PDF | View/Open |
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