Please use this identifier to cite or link to this item: http://nopr.niscpr.res.in/handle/123456789/43710
Title: Modernization of copper chips synthesized by top down approach in addition to W-H plot, EDAX and extensive X-ray diffraction studies
Authors: Vetrivel, Santhakumaran
Ramesh, Sengottuvelu
Keywords: Ball milling;Peak indexing;W-H plot;Dislocation density;SEM
Issue Date: Dec-2017
Publisher: NISCAIR-CSIR, India
Abstract: In this present study, synthesis and characterization of copper (Cu) nanoparticles have been reported. The low-cost, effective and eco-friendly top down technique is adopted for the synthesis of Cu nano particles from machined Cu chips. The copper chips are treated in a high energy planetary ball mill using tungsten (W) grinding ball media for 25 h and 50 h at 300 rpm under the pure argon gas as the process control agent (PCA) for avoiding oxidation. The ball to powder weight ratio is maintained at 10:1. The obtained samples are characterized using ultra violet spectra, visible spectroscopy (UV-vis), X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDAX). From the XRD results phase evolution, d-spacing, dislocation density, peak indexing remarks and particle size are determined. The XRD study shows that the prepared samples are holo crystalline in nature. X-ray peak analysis is carried out to calculate the lattice strain from Williamson-Hall (W-H) plot. The optical properties of the milled Cu sample are studied using UV-Vis spectra. The SEM images confirm the nanostructure of prepared copper nanoparticles. The EDAX results reveal that the samples are in pure form.
Page(s): 455-460
ISSN: 0975-1017 (Online); 0971-4588 (Print)
Appears in Collections:IJEMS Vol.24(6) [December 2017]

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